M00013477
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IEC 61189-5-503 Ed. 1.0 b:2017 Test methods for electrical materials, printed board and other interconnection structures and assemblies - Part 5-503: General test method for materials and assemblies - Conductive anodic filaments (CAF) testing of circuit boards
standard by International Electrotechnical Commission, 05/22/2017
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Availability date: 08/12/2021